X-ray microscopy is one of the most powerful tools scientists have for studying the structure of objects at the nanoscale. However, its utility is limited by a fundamental limitation known as the Abbe Limit.

Recently, researchers have developed a new technique that could dramatically improve the capabilities of X-ray microscopy. This new technique, known as the “multi-grating interferometry” method, can be used to measure objects at resolutions up to ten times better than the Abbe Limit. This breakthrough could be a game-changer for nanoscale research, allowing scientists to study objects at unprecedented levels of detail.

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source: Phys.org