Recently, researchers at the University of California, San Diego, have developed a new method for visualizing the spatial electric properties of materials at the microscopic level. This method enables researchers to observe how charges move within a material and can be used to study both natural and artificial materials. The researchers used a combination of high resolution electron microscopy and a technique known as electron energy loss spectroscopy (EELS) to create images of the spatial electric properties of the material. By combining both techniques, researchers were able to observe the movement of electrons within the material and gain an unprecedented level of insight into the material’s structure. This new method could be used to develop more efficient materials for use in electronics, energy storage, and transportation.

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source: Phys.org