In a breakthrough study, scientists from the University of Chicago have developed a new technique called High Energy Electron Xtallography (HEEX) to analyze the structure of materials at the nanoscale. This technique uses high-energy electrons to image nanoscale materials, enabling researchers to observe the structure of materials with unprecedented accuracy and resolution. With HEEX, scientists can now more accurately measure the properties of materials at the nanoscale, such as the size, shape, and arrangement of atoms. This technique could also be used to study the electronic structure of materials, enabling researchers to gain a better understanding of how materials interact with each other at the nanoscale.

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source: Phys.org