Using TERS to Unlock the Secrets of Semiconductor Particles
In a recent breakthrough, a team of researchers has successfully used tip-enhanced spectroscopy to gain greater insight into the molecular-scale structure of semiconductor particles. This technique, which combines atomic force microscopy (AFM) with infrared spectroscopy, provides a powerful tool for studying particles at the atomic level. The researchers were able to analyze the structure of the particles with unprecedented detail, revealing new insights into their properties and behavior. This research could have a significant impact on the development of semiconductor-based materials, such as those used in solar cells, transistors, and other electronic devices.
source: Phys.org