Today, a revolutionary new spectroscopic ellipsometer has been unveiled that allows scientists to measure the thickness of a material at an atomic level. This breakthrough technology could have far-reaching implications for the fields of nanotechnology, optical engineering and materials science. With this new micro ellipsometer, scientists can now measure the thickness of a material on the nanometer scale with an unprecedented level of accuracy. This could help them gain greater insight into the properties of thin films and surfaces, providing invaluable data for a range of industries.

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source: Phys.org