Solving the Long-Standing Problem of Transmission Electron Microscopy
In recent years, scientists have been researching a long-standing problem in Transmission Electron Microscopy (TEM) – the difficulty of obtaining high resolution images. TEM is an essential tool in material science, allowing researchers to visualize the structure of materials at the atomic level. However, obtaining a high resolution image with TEM is often challenging, as the images are affected by various sources of noise and blurring. By understanding the sources of noise and blurring in TEM, scientists can develop new methods to reduce these effects and improve the resolution of TEM images. A team of researchers at the University of Cambridge have been investigating this problem and have identified a new way to reduce noise and blurring in TEM images. Their findings, recently published in Nature Communications, could revolutionize the field of TEM imaging.
source: Phys.org