Neutralizing Electronic Inhomogeneity in Cleaved Bulk Materials: A Promising Step Toward Moving Beyond Silicon
Today, researchers from the Institute of Physics have announced a breakthrough in the field of electronics: a new technique for neutralizing the inhomogeneity of cleaved bulk materials. This technique could revolutionize the way we use electronics in our daily lives. By using a combination of atomic force microscopy and scanning tunneling microscopy, the scientists were able to observe and manipulate the material at the atomic scale, allowing them to precisely identify and mitigate the inhomogeneity of the material. This discovery could open the door to a variety of new applications, including improved efficiency in solar cells, better structural integrity in memory chips, and greater power output in transistors. With this breakthrough, the possibilities for electronic devices are limitless.
source: Phys.org