X-ray techniques have been used in scientific research and industry for decades, but new advances are now allowing researchers to get a deeper understanding of materials than ever before. In a recent paper published in Nature Communications, researchers describe a new x-ray technique that can be used to study the internal structure of materials in unprecedented detail. The technique, called x-ray diffraction tomography, uses a combination of x-ray diffraction and tomographic imaging to analyze the structure of materials at the atomic level. The researchers found that by using this technique, they could determine the size, shape, and composition of the material, as well as the orientation of individual atoms within the material. This provides a much deeper understanding of the material than previously possible. The results of this research could lead to new insights into the behavior of materials and could pave the way for the development of more advanced materials with improved properties.

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source: Phys.org