A new machine is changing the way scientists look at X-ray diffraction data. The machine, developed by researchers at the University of Michigan and the Lawrence Livermore National Laboratory, is able to rapidly sift through vast amounts of data from X-ray diffraction experiments and identify key patterns in the data. This machine is capable of analyzing vast amounts of data in a short amount of time, allowing scientists to gain a better understanding of the crystalline structures of materials. This technology could revolutionize the way scientists look at X-ray diffraction data, potentially leading to more accurate results and faster discovery.

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source: Phys.org