Recent technological advances have made it easier and faster for scientists and engineers to analyze materials at the microstructure level. By utilizing a new imaging technique called X-ray nanotomography, researchers are now able to observe and measure the minute details of a material’s inner structure with unprecedented clarity. This technique allows scientists to measure the size and shape of particles within a material, as well as the size and shape of the pores in between them. With this new technology, engineers can gain a better understanding of the material’s properties and performance, and make more informed decisions about how to use it.

Read Full Article Here

source: Phys.org