It’s a new era in nanoscale dielectric coatings! Scientists have developed an all-fiber ellipsometer system that can measure coating thickness and refractive index of nanoscale dielectric coatings with unprecedented accuracy. This system uses a high-precision spectral-domain ellipsometer which is coupled to a two-mode fiber-optic component. It has the potential to revolutionize the way nanoscale coatings are measured and could have broad implications for a variety of industries.

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source: Phys.org